According to research published in The Journal of Physical Chemistry Letters, Prof. Ding Junfeng from Institute of Solid State Physics (ISSP), Hefei Institutes of Physical Science, together with Prof. Wang Weihua from Nankai University, clarified the high-pressure structure of CrSiTe3, and highlighted the ultralow-frequency Raman spectroscopy when detecting the interlayer coupling on two-dimensional (2D) van der Waals materials.
